Fluke MET/CAL Procedure ============================================================================= INSTRUMENT: Fluke 78: (1 year) CAL VER /5100,5220,8842,5191 DATE: 16-Sep-97 AUTHOR: Fluke Corporation REVISION: $Revision: 1.6 $ ADJUSTMENT THRESHOLD: 70% NUMBER OF TESTS: 44 NUMBER OF LINES: 276 CONFIGURATION: Fluke 5100B CONFIGURATION: Fluke 5220A CONFIGURATION: Fluke 8842A CONFIGURATION: Philips PM 5191 ============================================================================= # # Source: # Fluke 78 Service Manual (PN 926923, March 1993, Errata No. 2, 9/94) # # Compatibility: # MET/CAL 4.0 or later # # Subprocedures: # None # # Required Files: # 51_COMP3.bmp # 51_78_2W.bmp # 51_78_HA.bmp # 51_78_F.bmp # 51_78RPM.bmp # # System Specifications: # TUR calculation is based on specification interval of the accuracy file. # The default 5100B accuracy file contains 6 month specs. # # Fluke makes no warranty, expressed or implied, as to the fitness # or suitability of this procedure in the customer's application. # # The 6 month specifications of the 5100B are used in TUR computations. # STEP FSC RANGE NOMINAL TOLERANCE MOD1 MOD2 3 4 CON 1.001 ASK- R N P F W 1.002 ASK+ K 1.003 HEAD EQUIPMENT SETUP 1.004 DISP [32] WARNING 1.004 DISP HIGH VOLTAGE is used or exposed during the performance 1.004 DISP of this calibration. DEATH ON CONTACT may result if 1.004 DISP personnel fail to observe safety precautions. 1.005 DISP Allow the UUT to stablize to room temperature 1.005 DISP 23degC +/-5degC (73degF +/-9degF). 1.005 DISP 1.005 DISP Check the fuses and battery, and replace them if 1.005 DISP necessary. 1.006 HEAD {DISPLAY TEST} 1.007 DISP Rotate the UUT function switch from OFF to VAC. 1.007 DISP 1.007 DISP AS the UUT is turned ON, verify that all display 1.007 DISP segments momentarily light up. 1.008 EVAL Did the UUT display test pass? 2.001 ASK- N U 2.002 HEAD RESISTANCE TESTS (Test Lead Compensation) 2.003 PIC 51_COMP3 2.004 IEEE [@8842]G5[I] 2.005 MATH MEM1 = MEM - 1100 2.006 JMPF 2.009 2.007 DISP Select FRONT INPUTS on the 8842A. 2.008 JMP 2.004 2.009 RESF 100Z S 2W 2.010 8842 100Z N 4W 2.011 MATH M[1] = MEM 2.012 RESF 1kZ S 2W 2.013 8842 1kZ N 4W 2.014 MATH M[2] = MEM 2.015 RESF 10kZ S 2W 2.016 8842 10kZ N 4W 2.017 MATH M[3] = MEM 2.018 RESF * S 2.019 HEAD {RESISTANCE TESTS} 2.020 DISP Select the Ohms Function. 2.021 HEAD RESISTANCE TESTS: {400 Ohm Range} 2.022 DISP Short the UUT Volt Ohm Diode and COM terminals together. 2.023 ACC 0.0Z TOL 2.024 MEMI Enter UUT reading in ohms: 2.025 MEME 2.026 MEMC 400 Z +0.2U 3.001 DISP Remove the short. 3.002 PIC 51_78_2W 3.003 RESF 100.0Z S 2W 3.004 ASK+ N U 3.005 MATH MEM = M[1] # 8842A 90 day accuracy, 200 Ohm Range 3.006 ACC 100 Z 0.007% 0.004U 3.007 MEMI Enter UUT reading in Ohms: 3.008 MEME 3.009 MEMC 400 Z 0.7U 4.001 ASK- U 4.002 HEAD RESISTANCE TESTS: {4 kOhm Range} 4.003 RESF 1kZ S 2W 4.004 ASK+ U 4.005 MATH MEM = M[2] # 8842A 90 day accuracy, 2 kOhm Range 4.006 ACC 1 kZ .005% .00003U 4.007 MEMI Enter UUT reading in kilohms: 4.008 MEME 4.009 MEMC 4 kZ 0.006U 5.001 ASK- U 5.002 HEAD RESISTANCE TESTS: {40 kOhm Range} 5.003 RESF 10.00kZ S 2W 5.004 ASK+ U 5.005 MATH MEM = M[3] # 8842A 90 day accuracy, 20 kOhm Range 5.006 ACC 10 kZ .005% .0003U 5.007 MEMI Enter UUT reading in kilohms: 5.008 MEME 5.009 MEMC 40 kZ 0.06U 6.001 HEAD RESISTANCE TESTS: {400 kOhm Range} 6.002 RESF 400 100.0kZ 0.6U 2W 7.001 HEAD RESISTANCE TESTS: {4 MOhm Range} 7.002 RESF 4 1.000MZ 0.006U 2W 8.001 HEAD RESISTANCE TESTS: {40 MOhm Range} 8.002 RESF 40 10.00MZ 0.13U 2W 9.001 HEAD {DIODE TEST} 9.002 DISP Rotate the UUT function switch to degC degF. 9.002 DISP Press the push button for 2s to select Diode (VDC) 9.003 EVAL Is the {beeper off}? 10.001 EVAL Is UUT displaying the {overload indicator} (-.OL-)? 11.001 5100 2.000V 0.080U 2W 12.001 HEAD {DC VOLTAGE TESTS} 12.002 DISP Rotate the UUT function switch to VDC. 12.003 DISP Press the push button 3 times to select AUTO 400mV Range 12.004 HEAD DC VOLTAGE TESTS: {400mV Range} 12.005 5100 400 0.000V 0.5U 2W 13.001 5100 400 350.0mV 0.3% 0.5U 2W 14.001 HEAD DC VOLTAGE TESTS: {4000mV Range} 14.002 5100 4000 3500mV 12U 2W 15.001 HEAD DC VOLTAGE TESTS: {4V Range} 15.002 DISP Press the push button twice to select AUTO 4V Range 15.003 5100 4 3.500V 0.012U 2W 16.001 MATH M[1] = MEM1 16.002 5100 4 -3.500V 0.012U 2W 17.001 MATH M[2] = MEM1 17.002 HEAD DC VOLTAGE TESTS: {4V Range, +/- reading difference} 17.003 MATH MEM1 = 0.0 17.004 MATH MEM = M[1] + M[2] 17.005 MEME 17.006 MEMC V 0.002U 18.001 HEAD DC VOLTAGE TESTS: {40V Range} 18.002 5100 40 35.00V 0.12U 2W 19.001 HEAD DC VOLTAGE TESTS: {400V Range} 19.002 5100 400 350.0V 1.2U 2W 20.001 HEAD DC VOLTAGE TESTS: {500V Range} 20.002 5100 500 500V 3U 2W 21.001 HEAD {AC VOLTAGE TESTS} 21.002 DISP Rotate the UUT function switch to VAC. 21.003 HEAD AC VOLTAGE TESTS: {4V Range} 21.004 5100 0.0mV S 2W 21.005 MEMI Enter UUT reading in volts AC: 21.006 MEME 21.007 MEMC 4 V +0.002U 22.001 5100 4 3.500V 0.090U 100H 2W 23.001 5100 4 3.500V 0.090U 1kH 2W 24.001 5100 4 3.000V 0.900U 20kH 2W 25.001 HEAD AC VOLTAGE TESTS: {40V Range} 25.002 5100 40 35.00V 0.90U 1kH 2W 26.001 HEAD AC VOLTAGE TESTS: {400V Range} 26.002 5100 400 350.0V 9.0U 1kH 2W 27.001 HEAD AC VOLTAGE TESTS: {500V Range} 27.002 5100 500 500V 15U 1kH 2W 28.001 ASK- N 28.002 HEAD {TEMPERATURE TESTS} 28.003 DISP Rotate the UUT function switch to degC degF. 28.004 HEAD TEMPERATURE TESTS: {UUT Internal} 28.005 5100 0V S 2W 28.006 MESS Does the display show a {steady reading} of the meter's 28.007 EVAL internal temperature? 29.001 MESS Is the {display flashing} the same temperature reading 29.002 EVAL at a rate of about once every 1.3 seconds? 30.001 MESS 30.002 DISP Remove all connections. 30.003 HEAD TEMPERATURE TESTS: {Ambient} 30.004 DISP Place the precision thermometer in the lag bath. 30.005 DISP Connect the 80T-150U to the 8842A and turn on the 30.005 DISP 80T-150U to degC. 30.006 DISP Immerse the probe of the 80T-150U to the same depth as 30.006 DISP the thermometer and allow the system to stabilize. 30.007 8842 20.000mV N 2W 30.008 MATH M[1] = MEM 30.009 MEMI Enter thermometer reading in degrees Celsius: # Calculate correction factor. 30.010 MATH M[1] = M[1] - MEM 30.011 DISP Remove the 80T-150U probe from the lag bath and insert 30.011 DISP it into the 78 COM input, down to the bottom. 30.011 DISP 30.011 DISP Allow the readings to settle. 30.012 8842 20.000mV N 2W # Correct 80T-150U/8842A reading. 30.013 MATH MEM1 = MEM - M[1] # This system tolerance must be modified to reflect the actual system accuracy 30.014 ACC 20.000degC 3U 30.015 MEMI Enter UUT reading in degrees Celsius: 30.016 MEME 30.017 MEMC degC 3U 31.001 DISP Remove all connections. 31.002 ASK+ N U 31.003 HEAD {CONTINUITY TEST} 31.004 DISP Rotate the UUT function switch to Ohms. 31.004 DISP Press the push button for 2s to select Continuity. 31.005 EVAL Is UUT displaying the {overload indicator} (-OL.-)? 32.001 EVAL Is the {beeper off}? 33.001 DISP Connect 30 Ohms between the V Ohm Diode & COM terminals. 33.002 EVAL Is the {beeper on}? 34.001 DISP Remove all connections. 34.002 HEAD {DC CURRENT TESTS} 34.003 DISP Rotate the UUT function switch to Amps DC. 34.004 PIC 51_78_HA 34.005 HEAD DC CURRENT TESTS: {4A Range} 34.006 5220 4 3.500A 0.040U 2W 35.001 HEAD DC CURRENT TESTS: {10A Range} 35.002 5220 10 10.00A 0.12U 2W 36.001 HEAD {AC MILLIAMP TESTS} 36.002 DISP Press the push button for 2s to select AC. 36.003 HEAD AC MILLIAMP TESTS: {10A Range} 36.004 5220 10 10.00A 0.27U 1kH 2W 37.001 DISP Remove all connections. 37.002 HEAD {FREQUENCY TEST} 37.003 DISP Rotate the UUT function switch to VAC. 37.003 DISP Press the push button for 2s to select Hz. 37.004 PIC 51_78_F 37.005 HEAD FREQUENCY TEST: {20kHz Range} 37.006 5191 20.00kH 0.02U 848mVpp -D SI 38.001 HEAD {DWELL TEST} 38.002 DISP Rotate the UUT function switch to Dwell. 38.003 5191 4.00V -D S 38.004 5191 8.00Vpp 100H -D TI S # This ACC statement forces "deg" instead of "Vpp" as units in the results. 38.005 ACC 52deg TOL 38.006 MEMI Enter UUT dwell reading (ex. XX in 4-XX): 38.007 MEME 38.008 MEMC deg 19U 39.001 ASK+ U 39.002 HEAD {DUTY CYCLE TEST} 39.003 DISP Press the push button for 2s to select %. 39.004 5191 1.70V -D S 39.005 5191 3.40Vpp 100H -D TI S 39.006 ACC 50pct 0.2% 39.007 MEMI Enter UUT reading in percent: 39.008 MEME 39.009 MEMC pct 14U 40.001 ASK- U 40.002 HEAD {RPM TEST} 40.003 DISP Rotate the UUT function switch to RPM. 40.004 PIC 51_78RPM 40.005 HEAD RPM TEST: {4V Range} 40.006 5191 1.7V -D S 40.007 5191 2Vpp 10H -D SQ S # This ACC statement forces "rpm" instead of "Vpp" as units in the results. 40.008 ACC 1200rpm TOL 40.009 MEMI Enter UUT reading in rpm: 40.010 MEME 40.011 MEMC rpm 4U 41.001 5191 3.8V -D S 41.002 5191 2Vpp 10H -D SQ S 41.003 EVAL Is UUT {displaying 0000}? 42.001 HEAD RPM TEST: {40V Range} 42.002 DISP Press the push button to select the 40V Range. 42.003 5191 3.8V -D S 42.004 5191 2Vpp 10H -D SQ S # This ACC statement forces "rpm" instead of "Vpp" as units in the results. 42.005 ACC 1200rpm TOL 42.006 MEMI Enter UUT reading in rpm: 42.007 MEME 42.008 MEMC rpm 4U 43.001 5191 1.7V -D S 43.002 5191 2Vpp 10H -D SQ S 43.003 EVAL Is UUT {displaying 0000}? 44.001 END